A cesium iodide/amorphous silicon flat panel detector is categorized as which type of detector?

The cesium iodide/amorphous silicon flat panel detector is categorized as an indirect digital detector due to its specific functioning and components. In this type of system, the cesium iodide layer acts as a scintillator that converts incoming x-ray photons into visible light. This visible light is then detected by the amorphous silicon layer, which converts it into an electronic signal that can be processed into a digital image.

The use of a scintillator in conjunction with a photodetector distinguishes this system as indirect. Unlike direct digital detectors, which convert x-ray photons directly into an electronic signal without the intermediate step of light conversion, the design and operation of this detector utilizes light created by the scintillator for signal generation. Thus, the indirect method of detection through light conversion is what classifies this particular detector system correctly. This understanding is crucial for recognizing the differences between various imaging technologies and their respective operational principles in fluoroscopy.